Focusing on most common root causes of failure yields reliable results.
Craig Truempi & Dan Yarmoluk
How the ability to detect defects has evolved and continues to advance today.
Craig Truempi is the director of AI and IIoT Reliability at Atek. Truempi has an MBA from the University of Minnesota. He may be reached at ctruempi@atekcompanies.com. Dan Yarmoluk is the business lead AI and data science at Atek. Yarmoluk holds a master’s degree of data science from the University of St. Thomas. He may be reached at dyarmoluk@atekcompanies.com. For more information, visit www.assetscan.com.